In order to develop realistic computational models of
hippocampal neurons using multi-comprartmental approaches,
there is a need for surface area estimations of the
dendritic trees of such neurons.
While light microscope data provide adequate accuracy at
the level of dendritic length and diameter (at least for
the proximal compartments), it is evident that when
dendritic spines are to be included in the model, these
data are no longer valid.
Instead of using electron microscopy of thin sections,
one could use high-voltage electron microscopy (HVEM) of
thick (3-5 microns), gaining a improved resolution.
However, HVEM measurements should be combined with
systematic sampling and serial electron microscopic
reconstruction of samples from the dendrites, in order to
yield accurate surface area estimates (e.g. Wilson et al.,
1983, J. Neurosci., 3):this means 3 different kinds of data
using 3 different microscopic techniques.
Recently, I heard about a new approach, that is, to use
axial tomographic reconstruction of dendrites from series
of HVEM images taken over a range of specimen tilt angles.
However,though, I tried to find a technical reference
on this one, that was impossible.
Does anyone have come across any relevant references ?
Thanks in advance (reply through either email or usenet)
Aristotle Univ of Thessaloniki School of Medicine