THE INTERNATIONAL CENTRE FOR DIFFRACTION DATA
ICDD YEAR 2000 Clinics on X-ray Fluorescence Spectrometry
Fundamentals of X-ray Fluorescence May 1-5, 2000
Advanced Methods in X-ray Fluorescence May 8-12, 2000
Course Outline
Session I - Fundamentals of X-ray Fluorescence
· Excitation and properties of X-rays
· X-ray fluorescence spectrometry
· Instrumentation and methods
· Detection and intensity measurements
· Pulse height selection and analysis
· Energy dispersive X-ray spectrometry
· Qualitative and semi-quantitative analysis
· Quantitative analysis
· Use of personal computers for qualitative and quantitative analysis
· Specimen preparation
· Discussion of examples and problems encountered by participants
· Special topics: as required
Session II - Advanced Methods in X-ray Fluorescence
· Brief review of fundamentals
· Properties of X-rays
· X-ray spectra
· Types and sources of error in X-ray spectrometry
· Factors affecting intensity of specimen emission lines
· Instrumentation for X-ray spectrometry
· Counting statistics: precision and accuracy of analysis
· Method of correction for matrix effects
· Computer methods for correction of matrix effects
· Specimen preparation and techniques
· Wavelength dispersive X-ray spectrometry
· Energy dispersive X-ray spectrometry
· Use of personal computers for qualitative and quantitative analysis
· Discussion of examples and problems encountered by participants
Location The ICDD X-ray Clinics are held at ICDD Headquarters, Newtown
Square Corporate Campus, 12 Campus Boulevard, Newtown Square,
Pennsylvania, U.S.A.
For more information contact Jeanne Ginsburg, Education Coordinator,
Tel: +610-325-9814, Fax: +610-325-9823, E-mail: clinics at icdd.com.
Information on all ICDD educational courses is posted on the ICDD web
site www.ICDD.com.
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International Centre for Diffraction Data
www.icdd.com, www.dxcicdd.com, www.ixas.org
webmaster at icdd
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